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Pego Electronics (Yi Chun) Company Limited
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Standard Test Finger for Accessiblity Test

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Standard Test Finger for Accessiblity Test

Brand Name : Pego Electronics

Model Number : PG-TPB

Certification : Third-Lab Calibration Certificate

Place of Origin : China

MOQ : 1 set

Price : Negotiation

Payment Terms : T/T, PayPal

Supply Ability : 1000pc/month

Delivery Time : 3 working days

Packaging Details : protection case+carton

Standard conform to : IEC61032, IEC60601, IEC62368-1, IEC60598-1, IEC60529

Material : insluating material (hanndle), and metal (finger)

Lead time : 3 working days

Application : for verifying the accessility to hazardous parts

Type : access probe

Thruster : 0N-50N

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Standard Test Finger for Accessiblity Test

1. Introduction

Standard test finger also be called as jointed test finger and test probe B, it is applied to simulate the human finger to verify the accessbility to hazardous parts of electrical and electronic devices. This probe is widely refered by IEC60335-1, IEC62368-1, IEC60598-1 and other products standards.

Standard test finger is strictly designed according to IEC61032 figure 2, it consists by inslating handle and metal finger. During the test, 10N and 30N forces are requested to apply, so this probe is built-in 0-50N thruster. A wire is lead out to connect with electrical indicator to indicate the accessibility of hazardous live parts.

2. Specification

Model PG-TPB
Jointed point size 1 30±0.2
Jointed point size 2 60±0.2
Length of finger 80±0.2
Fingertip to baffle size 180±0.2
Fingertip taper fillet S4±0.05
Diameter of finger Ф12 0 -0.05
Diameter of baffle Ф75±0.2
Thickness of baffle 5±0.5
A-A section diameter Ф50
A-A section width Ф20±0.2
Thruster 10N optional
Standard IEC61032

Standard Test Finger for Accessiblity Test


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